Artech.House.Publishers.Production.Testing.of.Rf.and.System.On.A.Chip.Devices.for.Wireless.Communications.Apr.2004.eBook-DDU
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┌────────────────────────────────────────────────────────────────────────────┐
│■■ » RELEASE iNFORMATiON « ■■│
└─┬────────────────────────────────────────────────────────────────────────┬─┘
│░│ TiTLE : Production Testing of Rf and System-On-A-Chip Devices │░│
│░│ for Wireless Communications (Artech House Microwave │░│
│░│ Library) │░│
│░├────────────────────────────────────────────────────────────────────────┤░│
│░│ AUTHOR : Keith B. Schaub, Joe Kelly │░│
│░├────────────────────────────────────────────────────────────────────────┤░│
│░│ PUBLISHER : Artech House Publishers │░│
│░├────────────────────────────────────┬───────────────────────────────────┤░│
│░│ iSBN : 1580536921 │ MAKER : Team DDU │░│
│░├────────────────────────────────────┼───────────────────────────────────┤░│
│░│ PAGES : 272 Pages │ PACKAGER : Team DDU │░│
│░├────────────────────────────────────┼───────────────────────────────────┤░│
│░│ EDiTiON : April 1, 2004 │ SUPPLiER : Team DDU │░│
│░├────────────────────────────────────┼───────────────────────────────────┤░│
│░│ LANGUAGE : ENGLISH │ FORMAT : PDF │░│
│░├────────────────────────────────────┼───────────────────────────────────┤░│
│░│ RLS DATE : 08/05/04 │ SiZE : 3.29 MB │░│
┌─┴────────────────────────────────────┴───────────────────────────────────┴─┐
│■■ » RELEASE NOTES « ■■│
└─┬────────────────────────────────────────────────────────────────────────┬─┘
│░│ │░│
│░│ [Product Information] │░│
│░│ │░│
│░│ ith the increasing number of integrated wireless devices being │░│
│░│ developed with SOC (system on a chip) technology, a merger of RF │░│
│░│ and mixed-signal test approaches is quickly becoming a necessity. │░│
│░│ Addressing this need head-on, this first-of-its-kind resource │░│
│░│ offers you an in-depth overview of RF and SOC product testing for │░│
│░│ wireless communications. The book introduces new, creative methods │░│
│░│ that lead to more efficient testing, such as multi-site and │░│
│░│ parallel testing. You learn how to determine critical measurements │░│
│░│ for specific applications, including Bluetooth, WLAN, and 3G │░│
│░│ devices. Moreover, the book shows you how to perform these │░│
│░│ measurements cost effectively in a production test environment. │░│
│░│ │░│
│░│ │░│
│░│ [Install Information] │░│
│░│ │░│
│░│ Unpack it ! │░│
│░│ │░│
│░│ [For more information] │░│
│░│ │░│
│░│ http://www.amazon.com/exec/obidos/tg/detail/-/1580536921/ │░│
│░│ │░│
┌─┴────────────────────────────────────────────────────────────────────────┴─┐
│■■ » CONTACT iNFORMATiON « ■■│
└─┬────────────────────────────────────────────────────────────────────────┬─┘
│░│ │░│
│░│ Nothing but suppliers ATM! │░│
│░│ │░│
│░│ If you wish to contact us, you may email us at: │░│
│░│ Email: TeamDDU[at]hotmail[dot]com │░│
│░│ │░│
┌─┴────────────────────────────────────────────────────────────────────────┴─┐
│■■ TEAM DDU ( Day Day UP ) 2004 x!FEAR ■■│
└────────────────────────────────────────────────────────────────────────────┘
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